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Session
21
: OLED Physics |
OLEDs
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Tuesday, May 14 / 03:40 PM - 5:00 PM / San Jose Convention Center, LL21CD
Chair:
Nicholas Thompson, Universal Display Corporation, Ewing, NJ USA
Co-Chair:
Anna Hayer, Merck KGaA, Darmstadt, Germany
21.1 - Invited Paper: Analysis of Capacitance Characteristics of Highly Efficient Blue OLEDs by Impedance Spectroscopy (3:40 PM - 4:00 PM)
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Hyosup Shin, Moran Ha, Sung-Soo Bae, Changwoong Chu
Samsung Display Corporation Yongin South Korea
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Makoto Yamamoto
Samsung Electronics Yokohama Japan
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This paper focuses on devices with phosphor-sensitized TADF emission where analyzed by impedance spectroscopy. The capacitance is largely affected by the giant surface potential (GSP) of the layers. The influence of GSP on capacitance is from the GSP value and the position of the GSP layers in the device. The authors explain the mechanism based on simulation.
21.2 - Modulus Spectroscopy and Capacitance-Voltage Measurement of OLEDs as Tools for Estimating Charge Dynamics (4:00 PM - 4:20 PM)
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Ji Nan, Yupei Zhang, Zhi Huang, Long Chen, Bong-Geum Lee
Tianma Microelectronics Co., Ltd. Shanghai China
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Using hole-only and electron-only devices (HODs and EODs) cannot fully explain the dynamic characteristics of OLEDs such as charge accumulation and recombination. In this study, the well-established techniques of modulus spectroscopy and capacitance-voltage measurement are combined and applied to describe the carrier dynamics in multilayer OLED devices at high temperature.
21.3 - Closed-Form Expression for the Current-Voltage Characteristics of OLEDs (4:20 PM - 4:40 PM)
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Khaled Ahmed
Intel Corporation Santa Clara CA US
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A new data-validated closed-form physics-based expression is derived for the I-V characteristics of OLEDs. Two parameters emerge from the new model: liminal current and liminal voltage. Both parameters are expressed in terms of device and material parameters. Robust parameter extraction methods are proposed and validated with experimental data.
21.4 - Understanding Bottom-Emission Blue OLED Efficiency, Lifetime Trends, and Capacitance Curves with Different EILs (4:40 PM - 5:00 PM)
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Wenbin Jia, Xiaoning Liu, Feng Li, Xiang Wan, Li Sun, Kaihong Ma, Minghong Xu, Juanjuan You, Huai-Ting Shih, Jianwei Yu
Hefei BOE Joint Technology Co., Ltd. Anhui China
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Kening Zheng
Chengdu BOE Technology Group Co., Ltd. Chengdu China
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The effects of different electron injection layers (NaF/LiF/Liq/ETL:Li) on electrical properties, lifetime, and capacitance are systematically explored on bottom-emission blue OLEDs. The authors can determine the aging speed and initial decay of the OLED device from the characteristics of the capacitance.